SCFB029 (40) Double-ended Pogo Pin Test Probe 5.7 mm in Total Length
Semiconductor test probes are usually called double-ended pogo pins. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
SCPB029 (40) is unique in shape among semiconductor test probes due to a convex ring at one end of its barrel.
Its parameters are as below. Materials (plated) Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated
Electronic Specification: Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 8.5 GHz at -1dB
Inductance: 1MHZ at -0.02661uH
Captance: 1MHZ at 0.925374uF
Specifications: Full Stroke: 1 mm
Rated Stroke: 0.65 mm
Spring Force: 14±4 gf at load 0.65 mm
Mechanical Life: about 100000 cycles
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